Charged particle optics, electron and ion focusing systems, and high-brightness sources are at the heart of Thermo Fisher’s Scanning Electron Microscope (SEM), Focused Ion Beam (FIB), and Dual Beam tools serving the Nanotechnology market. The FIB Group seeks an intern to assist with the development and characterization of the next generation FIB columns. Activities include one or more of the following:

• Develop and perform experiments to help characterize focused ion beams performance
• Analyze experimental data and write reports
• Perform simulations of charged particles optics systems for focused ion columns
• Analyze electromagnetic fields, high voltage design, magnetic shielding, mechanical design, vacuum systems, and material selection
• Maintain, troubleshoot, and repair laboratory equipment as necessary

Minimum Education, Experience and Qualifications:

• Typically requires a degree in Physics or Engineering
• Experience operating Thermo Fisher’s Dual Beam systems and microscopes is a plus
• Demonstrated laboratory experience and hands-on skills
• Computer programming experience is desired